New method of thinning photoelastic interference fringes in image processing

Yuan Peng Zhang

doi:10.1117/12.49536

1 December 1991 New method of thinning photoelastic interference fringes in image processing

Yuan Peng Zhang

Proceedings Volume 1554, Second International Conference on Photomechanics and Speckle Metrology; (1991) https://doi.org/10.1117/12.49536
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

The recorded optical interference fringes are often expanded and blurred, therefore a suitable thinning procedure is necessary and important in image processing.

This paper presents a new thinning method of optical interference fringes. After scanning the fringe pattern row by row, the distribution of the gray level along a row is obtained. After fitting, the extrema of the curves are determined, which denote the position of the integer, minimal light intensity fringes. The advantage of presented method is that the evaluation is simple, the processing speed is faster, and the results are satisfactorily precise, compared with the classical methods.

Citation Download Citation

Yuan Peng Zhang "New method of thinning photoelastic interference fringes in image processing", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.49536

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available