1 December 1991 Some applications of a HOE-based desensitized interferometer in materials research
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Abstract
A holographic method suited for the measurement of flatness deviation is presented. This method takes advantage of the basic Fizeau arrangement usually meant for contouring analysis of relatively flat bodies. A desensitized interferometer is described allowing the measurement of rough objects, as frequently encountered in engineering practice. The key component of this interferometer is a diffractive optical element produced by recording two-wave interference patterns. Desensitization factors ranging from 1 to 100 with respect to a Fizeau interferometer can be achieved. Flatness checks of computer disks demonstrate the possibilities of the interferometer; deformation measurements performed with the desensitized interferometer on classical experimental mechanics specimens are presented: static testing on notched C-rings and on welds, and fatigue testing on notched three-point bend tests.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre Michel Boone, Pierre M. Jacquot, "Some applications of a HOE-based desensitized interferometer in materials research", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.49573; https://doi.org/10.1117/12.49573
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