1 December 1991 Spatial phase-shifting techniques of fringe pattern analysis in photomechanics
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The spatial phase-shifting techniques providing the robust technique for displacement, shape and deformation measurement are presented, specifically the phase-stepped (PS) and spatial-carrier phase-shifting methods (SCPS). The first technique requires modification of holographic, speckle and moiré interferometers by inserting an additional grating and forming three parallel channels with phase-shifted interferograms. In the second technique a large amount of tilt is introduced into a fringe pattern, so that the phase difference between succesive pixels equals a known, constant value (e.g. Π/2).

As both techniques require for the phase calculation a single frame only, they are specially capable for the analysis of transient events and for performing measurements in adverse conditions. The error considerations and the examples of applications of this methods are presented. The advantages and disadvantages of these two spatial methods in comparison with temporal phase-shifting technique are given.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Malgorzata Kujawinska, Malgorzata Kujawinska, Joanna Wojiak, Joanna Wojiak, "Spatial phase-shifting techniques of fringe pattern analysis in photomechanics", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.57434; https://doi.org/10.1117/12.57434

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