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1 December 1991 Speckle measurement for 3-D surface movement
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Abstract
For measuring 3D surface movement by means of Electronic-Speckle-Pattern-Interferometry the decorrelation of the out-of-plane component due to the additional inplane movement must be minimized by a resampling of the speckle images or the calculated phase maps in dependence of the measured inplane movement.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jens Hilbig and Reinhold Ritter "Speckle measurement for 3-D surface movement", Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); https://doi.org/10.1117/12.49498
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