PROCEEDINGS VOLUME 1556
SAN DIEGO, '91 | 21-21 JULY 1991
Scanning Microscopy Instrumentation
IN THIS VOLUME

4 Sessions, 21 Papers, 0 Presentations
SAN DIEGO, '91
21-21 July 1991
San Diego, CA, United States
Near-Field Optical Microscopy
Proc. SPIE 1556, Solid immersion lens photon tunneling microscope (Invited Paper), 0000 (1 February 1992); doi: 10.1117/12.134882
Proc. SPIE 1556, Field detection by subwavelength aperture probes, 0000 (1 February 1992); doi: 10.1117/12.134883
Proc. SPIE 1556, Imaging of near-field diffraction patterns with subwavelength resolution in the optical region, 0000 (1 February 1992); doi: 10.1117/12.134884
Force and Tunneling Microscopy
Proc. SPIE 1556, Near-field acoustic microscopy (Invited Paper), 0000 (1 February 1992); doi: 10.1117/12.134885
Proc. SPIE 1556, Imaging of biological material with STM/AFM (Invited Paper), 0000 (1 February 1992); doi: 10.1117/12.134886
Proc. SPIE 1556, Metrics for metrology on an atomic scale (Abstract Only), 0000 (1 February 1992); doi: 10.1117/12.134887
Proc. SPIE 1556, Study of LDEF particulate contamination using atomic force microscopy, 0000 (1 February 1992); doi: 10.1117/12.134888
Proc. SPIE 1556, Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy, 0000 (1 February 1992); doi: 10.1117/12.134889
New Microscopy Techniques
Proc. SPIE 1556, Nanoscale semiconductor impurity characterization by scanned probe microscopy (Invited Paper), 0000 (1 February 1992); doi: 10.1117/12.134890
Proc. SPIE 1556, Scanning cone-beam reconstruction algorithms for x-ray microtomography, 0000 (1 February 1992); doi: 10.1117/12.134891
Proc. SPIE 1556, Measurement of photothermal vibrational displacement by a focusing error sensor, 0000 (1 February 1992); doi: 10.1117/12.134892
Proc. SPIE 1556, Microinterferometry to 1 pm (Invited Paper), 0000 (1 February 1992); doi: 10.1117/12.134893
Proc. SPIE 1556, New spectrally resolved confocal scanning laser microscope, 0000 (1 February 1992); doi: 10.1117/12.134894
Optical Microscopy
Proc. SPIE 1556, Two-photon excitation in scanning laser microscopy (Abstract Only), 0000 (1 February 1992); doi: 10.1117/12.134895
Proc. SPIE 1556, Optimal disc design for a confocal microscope, 0000 (1 February 1992); doi: 10.1117/12.134896
Proc. SPIE 1556, New transmission and double-reflection scanning beam confocal microscope: applications in transmission (Invited Paper), 0000 (1 February 1992); doi: 10.1117/12.134897
Proc. SPIE 1556, Three-dimensional structural analysis from biological confocal images, 0000 (1 February 1992); doi: 10.1117/12.134898
Proc. SPIE 1556, Scanning confocal microscope for precise measurement of optical fiber diameter, 0000 (1 February 1992); doi: 10.1117/12.134899
Proc. SPIE 1556, High-resolution differential phase and amplitude optical microscope, 0000 (1 February 1992); doi: 10.1117/12.134900
Proc. SPIE 1556, Method of sampling and positioning for laser scanning microscope: load cell method (Proceedings Only), 0000 (1 February 1992); doi: 10.1117/12.134901
Force and Tunneling Microscopy
Proc. SPIE 1556, Application of a 2-D atomic force microscope system to metrology, 0000 (1 February 1992); doi: 10.1117/12.134902
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