1 February 1992 Imaging of near-field diffraction patterns with subwavelength resolution in the optical region
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Abstract
Near-field microscopy techniques are ideally suited for the determination of optical electromagnetic field structures with high spatial resolution. In this paper we report some preliminary results of our experiments on the near-field diffraction by a straight-edge and on the fields emanating from a single mode optical fiber. It is suggested that near-field techniques might provide an excellent approach to characterizing the properties of optical fibers.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Duncan J. Butler, Duncan J. Butler, Keith A. Nugent, Keith A. Nugent, Ann Roberts, Ann Roberts, Patrick D. Kearney, Patrick D. Kearney, } "Imaging of near-field diffraction patterns with subwavelength resolution in the optical region", Proc. SPIE 1556, Scanning Microscopy Instrumentation, (1 February 1992); doi: 10.1117/12.134884; https://doi.org/10.1117/12.134884
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