Blind deconvolution is a typical solution to unknown LSI system inversion problems. When only the output is available, second order statistics are not sufficient to retrieve the phase of the LSI system, so that some form of higher-order analysis has to be employed. In this work, a general iterative solution based on a Bayesian approach is illustrated, and some cases both for mono and bidimensional applications are discussed. The method implies the use of non second-order statistics (rather than higher-order statistics), tuned to specific a priori statistical models. The Bayesian approach yields specific solutions corresponding to known techniques, such as MED deconvolution employed in seismic processing, and more sophisticated procedures for non-independent identically distributed (for instance Markovian) inputs.