Translator Disclaimer
1 December 1991 Fast one-pass algorithm to label objects and compute their features
Author Affiliations +
Abstract
In many image processing applications, labeling objects and computing their features for recognition are crucial steps for further analysis. In general these two steps are done separately. This paper proposes a new approach to label all objects and computer their features (such as moments, best fit ellipse, major and minor axis) in one pass. The basic idea of the algorithm is to detect interval overlaps among the line segments as the image is scanned from left to right, top to bottom. Ambiguity about an object's connectivity can also be resolved with the proposed algorithm. It is a fast algorithm and can be implemented on either serial or parallel processors.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tan Q. Thai "Fast one-pass algorithm to label objects and compute their features", Proc. SPIE 1567, Applications of Digital Image Processing XIV, (1 December 1991); https://doi.org/10.1117/12.50866
PROCEEDINGS
9 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Parallel architectures for binary image algebra
Proceedings of SPIE (October 31 1990)
Line Thinning via Merge Split in Run Length Sequences of...
Proceedings of SPIE (February 28 1990)
Fast texture image segmentation
Proceedings of SPIE (October 31 1990)
Fast alignment of marks in COG bonding based on multi...
Proceedings of SPIE (November 14 2007)

Back to Top