1 March 1992 Fourier spectroscopy of superthin films on metals: comparison of surface electromagnetic waves spectroscopy and reflection-absorption spectroscopy
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Proceedings Volume 1575, 8th Intl Conf on Fourier Transform Spectroscopy; (1992) https://doi.org/10.1117/12.56418
Event: Eighth International Conference on Fourier Transform Spectroscopy, 1991, Lubeck-Travemunde, Germany
Abstract
Theoretical and experimental comparison of the sensitivity of two non-destructive methods (SEWS and RAS) has proved that in the linear approximation for super-thin films, the sensitivity of SEWS is higher than RAS and is increasing with the increase of the relation (root)/(root)(tau ) ((root) equals film frequency absorption band, (root)(tau ) equals collision frequency of free carriers in the metal).
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. Yu. Gushanskaya, N. Yu. Gushanskaya, Valery A. Voronin, Valery A. Voronin, V. A. Yakovlev, V. A. Yakovlev, Guerman N. Zhizhin, Guerman N. Zhizhin, } "Fourier spectroscopy of superthin films on metals: comparison of surface electromagnetic waves spectroscopy and reflection-absorption spectroscopy", Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); doi: 10.1117/12.56418; https://doi.org/10.1117/12.56418
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