Optical characterization of superconductive thin films by dispersive FT spectroscopy

Fernando Romero-Borja; J. Linkemann; H. O. Tittel; R. Stenzel

doi:10.1117/12.56360

1 March 1992 Optical characterization of superconductive thin films by dispersive FT spectroscopy

Fernando Romero-Borja, J. Linkemann, H. O. Tittel, R. Stenzel

Proceedings Volume 1575, 8th Intl Conf on Fourier Transform Spectroscopy; (1992) https://doi.org/10.1117/12.56360
Event: Eighth International Conference on Fourier Transform Spectroscopy, 1991, Lubeck-Travemunde, Germany

Abstract

Some preliminary room-temperature measurements on thin-films superconductors using Dispersive Fourier Transform Spectroscopy (DFTS) in reflection are presented. Directly measured phase and amplitude reflectivity spectra in visible light are used to illustrate experimental difficulties when trying to determine optical properties of these materials. Some observations about the surface quality of the samples are discussed in connection with the obtained results.

Citation Download Citation

Fernando Romero-Borja, J. Linkemann, H. O. Tittel, and R. Stenzel "Optical characterization of superconductive thin films by dispersive FT spectroscopy", Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); https://doi.org/10.1117/12.56360

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