1 March 1992 Photometric accuracy of FTIR spectrometers
Author Affiliations +
Proceedings Volume 1575, 8th Intl Conf on Fourier Transform Spectroscopy; (1992) https://doi.org/10.1117/12.56347
Event: Eighth International Conference on Fourier Transform Spectroscopy, 1991, Lubeck-Travemunde, Germany
Abstract
High photometric accuracy is essential for precise measurements of optical properties. The effect of source radiation power on the photometric accuracy is a mechanism of growing importance, since modern FTIR spectrometers possess strong sources for high signal-to-noise ratio. A related problem is radiation incident on the detector from a high-temperature sample. This paper presents an analysis of the photometric error in the reflectance measurements for samples at high temperatures. The maximum temperature that can be investigated as a function of the required photometric accuracy is determined for several dielectric crystals and film- substrate composites.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Markus I. Flik, Z. M. Zhang, "Photometric accuracy of FTIR spectrometers", Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); doi: 10.1117/12.56347; https://doi.org/10.1117/12.56347
PROCEEDINGS
2 PAGES


SHARE
Back to Top