1 March 1992 Sampling problems in Fourier transform photoluminescence and their consequences on the computed spectra
Author Affiliations +
Proceedings Volume 1575, 8th Intl Conf on Fourier Transform Spectroscopy; (1992) https://doi.org/10.1117/12.56382
Event: Eighth International Conference on Fourier Transform Spectroscopy, 1991, Lubeck-Travemunde, Germany
Abstract
We have performed photoluminescence (PL) measurements on III - V semiconductor materials. InP and related compounds, used in fiber-optic communication. The PL radiation is excited with an argon laser ((lambda) equals 488 nm) and collected by a liquid nitrogen cooled Ge detector (spectral range 5800 - 15000 cm-1). The sampling of the PL signal, using a He-Ne reference laser, occurs every (Delta) d equals (lambda) REF/2 equals 316.4 nm of the optical path difference (OPD) due to the displacement of the movable mirror; the maximum wavenumber detectable, without aliasing problems, is (sigma) M equals 1/2 (Delta) d 15803 (cm-1). In a real instrument, considering the possibility of small errors in the position of the movable mirror, the value of the OPD dj in the sampled points is given by dj equals -L + j(Delta) d + (epsilon) (d), j equals 0,1,2,...N - 1, where L is the maximum displacement of the movable mirror, N is the number of sampled points and (epsilon) (d) is the error in the value of the OPD caused by an erroneous position of the movable mirror.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Carlo Lamberti, Almerino Antolini, "Sampling problems in Fourier transform photoluminescence and their consequences on the computed spectra", Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); doi: 10.1117/12.56382; https://doi.org/10.1117/12.56382
PROCEEDINGS
2 PAGES


SHARE
Back to Top