1 October 1991 A 30 to 100 GHz solid state noise source for millimetre-wave spectrometry
Author Affiliations +
Proceedings Volume 1576, 16th International Conference on Infrared and Millimeter Waves; 15760Z (1991) https://doi.org/10.1117/12.2297748
Event: 16th International Conference on Infrared and Millimeter Waves, 1991, Lausanne, Switzerland
Abstract
Measurements of the dielectric and optical properties of materials (complex refractive indices, dielectric constants, magneto and electro-optic coefficients etc.) over wide ranges of frequency above 300 GHz are made by Fourier transform spectrometry and dispersive Fourier transform spectrometry. These techniques utilise mercury arc lamps as broadband noise sources with noise temperatures of about 2000 K. For frequencies below 300 GHz the spectrometric methods are still applicable but the power available from mercury arc lamps is very low (< 2000 K) and below about 100 GHz spectrometric measurements require long integration times to reach acceptable signal-to-noise ratios.

Waveguide mounted noise diodes are used for power calibration of microwave systems at frequencies below 60 GHz. They have fairly high noise temperatures but are limited in frequency coverage to a single waveguide band.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. W. Bowen, J. W. Bowen, } "A 30 to 100 GHz solid state noise source for millimetre-wave spectrometry", Proc. SPIE 1576, 16th International Conference on Infrared and Millimeter Waves, 15760Z (1 October 1991); doi: 10.1117/12.2297748; https://doi.org/10.1117/12.2297748
PROCEEDINGS
2 PAGES


SHARE
RELATED CONTENT

A 30 300 Ghz broad band dispersive Fourier...
Proceedings of SPIE (November 30 1990)
A Spectral Radiance Comparison Of A Noise Tube And A...
Proceedings of SPIE (September 23 1987)
FT spectrometer with fixed mirrors using Fizeau fringes
Proceedings of SPIE (February 29 1992)
The current status of GOSAT and the concept of GOSAT...
Proceedings of SPIE (November 18 2012)

Back to Top