1 October 1991 S-parameter measurements using a three-probe circuit
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Proceedings Volume 1576, 16th International Conference on Infrared and Millimeter Waves; 157651 (1991) https://doi.org/10.1117/12.2297894
Event: 16th International Conference on Infrared and Millimeter Waves, 1991, Lausanne, Switzerland
Abstract
A three-probe microstrip measurement scheme has been successfully used for input impedance and S-parameter measurements. This paper reports several alternative configurations for these measurements.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ming-Yi Li, Ming-Yi Li, } "S-parameter measurements using a three-probe circuit", Proc. SPIE 1576, 16th International Conference on Infrared and Millimeter Waves, 157651 (1 October 1991); doi: 10.1117/12.2297894; https://doi.org/10.1117/12.2297894
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