1 October 1991 Influence of surface current expansions in the analysis of dielectric-loaded cavities with the equivalence principle
Author Affiliations +
Proceedings Volume 1576, 16th International Conference on Infrared and Millimeter Waves; 157656 (1991) https://doi.org/10.1117/12.2297899
Event: 16th International Conference on Infrared and Millimeter Waves, 1991, Lausanne, Switzerland
Abstract
Recently the application of the equivalence principle to the analysis of metal- and dielectric-loaded cavities and waveguides has been suggested in [1]-[5]. In comparison to other methods, the original problem is reduced with respect to its dimensions. This drastically reduces the size of the characteristic matrix.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. Jöstingmeier, "Influence of surface current expansions in the analysis of dielectric-loaded cavities with the equivalence principle", Proc. SPIE 1576, 16th International Conference on Infrared and Millimeter Waves, 157656 (1 October 1991); doi: 10.1117/12.2297899; https://doi.org/10.1117/12.2297899
PROCEEDINGS
2 PAGES


SHARE
Back to Top