Paper
4 December 2017 Frequency domain analysis of the orotron
S. Lütgert
Author Affiliations +
Proceedings Volume 1576, 16th International Conference on Infrared and Millimeter Waves; 15767T (2017) https://doi.org/10.1117/12.2297994
Event: 16th International Conference on Infrared and Millimeter Waves, 1991, Lausanne, Switzerland
Abstract
A nonlinear self-consistent frequency domain analysis of the orotron is presented. The problem is separated into a linear and a nonlinear part. In the frequency domain, the cavity and load are described by a linear admittance, whereas the behaviour of the electron beam under the influence of the e.m. field is described by a nonlinear admittance, which depends on both frequency and amplitude of the e.m. field. An operating point is found when the load admittance equals the beam admittance. The shape of the device line, i.e. the locus of the beam admittance in the complex plane, gives useful informations about the optimum system parameters. To check the analysis, the results have been compared with time domain calculations.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Lütgert "Frequency domain analysis of the orotron", Proc. SPIE 1576, 16th International Conference on Infrared and Millimeter Waves, 15767T (4 December 2017); https://doi.org/10.1117/12.2297994
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KEYWORDS
Electron beams

Beam shaping

Extremely high frequency

Maxwell's equations

Oscillators

Transmission electron microscopy

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