4 December 2017 A rigorous analysis for dispersion charateristics of dielectric periodic structures: oblique incidence case
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Proceedings Volume 1576, 16th International Conference on Infrared and Millimeter Waves; 157685 (2017) https://doi.org/10.1117/12.2298006
Event: 16th International Conference on Infrared and Millimeter Waves, 1991, Lausanne, Switzerland
Abstract
The periodic dielectric structures on which the surface waves propagating at an angle to the gratings have recently been finding increasing applications in optical and millimeter wave integrated circuits. Strong interest in researching this kind of problem appears in the literature. For the oblique incidence case the electromagnetic boundary value problem becomes a three dimensional vector one that supports only hybrid modes and requires the coupling between TE and TM modes. There are two types of methods used to analyze the dispersion characteristics of the dielectric periodic structures. One is coupled-mode approach which expands the fields in the periodic structure in terms of eigen-modes in unperturbed wavegiude and offers relatively simpler analysis procedure with an assumption that the periodic layer acts as only a small perturbation in a planar multilayered medium. This approximation yields good results only if the periodic change is sufficiently small, so that its use may produce erroneous results in many practical cases; the other is Floguet-Bloch expansion method which uses an expansion of fields in terms of Floque space harmonics and the propgation of EM waves along periodic dielectric structures is formulated as a rigorous boundary value problem. The rigorous treatment gives very accurate results. However, it is rather complex and requires time consuming and elaborate high precision computer program to yield accurate quantitative results, it is not economic from viewpoint of engineering.
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Liguo Sun, Liguo Sun, } "A rigorous analysis for dispersion charateristics of dielectric periodic structures: oblique incidence case", Proc. SPIE 1576, 16th International Conference on Infrared and Millimeter Waves, 157685 (4 December 2017); doi: 10.1117/12.2298006; https://doi.org/10.1117/12.2298006
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