1 December 1991 Characterization of planar optical waveguides by K+ ion exchange in glass at 1.152 and 1.523 μm
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Proceedings Volume 1583, Integrated Optical Circuits; (1991) https://doi.org/10.1117/12.50870
Event: OE Fiber, 1991, Boston, MA, United States
Abstract
The WKB relation and mode indices measurement have been used to determine the important surface index change and effective depth of planar K+-ion exchanged waveguides in soda-lime glass at 1.152 and 1.523 mm for any given set of fabrication temperature and time, whereas the substrate index can be determined by a multi-layer Brewster angle measurement. The data obtained are important in the design and fabrication of K+-ion exchanged waveguides in single-mode fiber systems at 1.3 and 1.55 pm.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gar Lam Yip, Gar Lam Yip, Kiyoshi Kishioka, Kiyoshi Kishioka, Feng Xiang, Feng Xiang, J. Y. Chen, J. Y. Chen, } "Characterization of planar optical waveguides by K+ ion exchange in glass at 1.152 and 1.523 μm", Proc. SPIE 1583, Integrated Optical Circuits, (1 December 1991); doi: 10.1117/12.50870; https://doi.org/10.1117/12.50870
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