Interferometric signal processing schemes for the measurement of strain

Timothy A. Berkoff; Alan D. Kersey

doi:10.1117/12.50176

1 December 1991 Interferometric signal processing schemes for the measurement of strain

Timothy A. Berkoff, Alan D. Kersey

Proceedings Volume 1588, Fiber Optic Smart Structures and Skins IV; (1991) https://doi.org/10.1117/12.50176
Event: OE Fiber, 1991, Boston, MA, United States

Abstract

In this paper we demonstrate the measurement of fiber strain for use in embedded sensor applications. Both of these methods utilize source frequency interrogation to monitor fiber strain. The first system described provides absolute strain information from a single-mode interferometric sensor used to measure absolute surface strain induced by deflection of a cantilever beam. The second system presented demonstrates remote interrogation of a lead insensitive two-mode elliptical core fiber sensor to measure relative changes in fiber strain.

Citation Download Citation

Timothy A. Berkoff and Alan D. Kersey "Interferometric signal processing schemes for the measurement of strain", Proc. SPIE 1588, Fiber Optic Smart Structures and Skins IV, (1 December 1991); https://doi.org/10.1117/12.50176

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