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1 December 1991 Interferometric signal processing schemes for the measurement of strain
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Abstract
In this paper we demonstrate the measurement of fiber strain for use in embedded sensor applications. Both of these methods utilize source frequency interrogation to monitor fiber strain. The first system described provides absolute strain information from a single-mode interferometric sensor used to measure absolute surface strain induced by deflection of a cantilever beam. The second system presented demonstrates remote interrogation of a lead insensitive two-mode elliptical core fiber sensor to measure relative changes in fiber strain.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Timothy A. Berkoff and Alan D. Kersey "Interferometric signal processing schemes for the measurement of strain", Proc. SPIE 1588, Fiber Optic Smart Structures and Skins IV, (1 December 1991); https://doi.org/10.1117/12.50176
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