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1 December 1991 Sapphire fiber interferometer for microdisplacement measurements at high temperatures
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Abstract
We report the use of a short-length, multimode sapphire rod as an extension to a Michelson configuration, but operated as a low-finesse Fabry-Perot cavity. We demonstrate the performance of such a device as an interferometric sensor, where the interference between the reflections from the sapphire-air interface and an air-metallic surface is observed for microdisplacement of the metallic surface which is placed close to the sapphire endface. We describe in detail the fabrication procedure and present results obtained from the detection of temperature changes, applied strain, and surface acoustic waves.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kent A. Murphy, Brian R. Fogg, George Z. Wang, Ashish M. Vengsarkar, and Richard O. Claus "Sapphire fiber interferometer for microdisplacement measurements at high temperatures", Proc. SPIE 1588, Fiber Optic Smart Structures and Skins IV, (1 December 1991); https://doi.org/10.1117/12.50170
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