Algorithm for quality inspection of characters printed on chip resistors

Yasuhiko Numagami; Yasuyuki Hattori; Osamu Nakamura; Toshi Minami

doi:10.1117/12.50324

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1 November 1991 Algorithm for quality inspection of characters printed on chip resistors

Yasuhiko Numagami, Yasuyuki Hattori, Osamu Nakamura, Toshi Minami

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Proceedings Volume 1606, Visual Communications and Image Processing '91: Image Processing; (1991) https://doi.org/10.1117/12.50324
Event: Visual Communications, '91, 1991, Boston, MA, United States

Abstract

An algorithm for quality inspection of characters printed on chip resistors is presented in this paper. Chip resistors are extremely small electronic parts used in small electronic devices, whose production have increased because of their ease of installation. To decrease production costs and ensure uniformity of quality, chip resistors are produced in automated manufacturing plants. Appearance inspection, however, still depends on visual inspection. It is quite difficult, however, to examine the printing quality of the characters printed on the chip resistor, because the characters are very small, reaching the limit of printing technology. Another difficulty is that, at present, there is no standard of quality. Only a few manuals exist describing defects. These have been written for use in individual factories and differ from factory to factory. Furthermore, even in one factory the criteria vary from one person to another. An automatic quality inspection system for the characters printed on such small chip resistors is urgently required.

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Yasuhiko Numagami, Yasuyuki Hattori, Osamu Nakamura, and Toshi Minami "Algorithm for quality inspection of characters printed on chip resistors", Proc. SPIE 1606, Visual Communications and Image Processing '91: Image Processing, (1 November 1991); https://doi.org/10.1117/12.50324

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