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1 November 1991 Best fit ellipse for cell shape analysis
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Shape analysis is important in classification where deviation of a contour from a model are measured. In pathology, deviation of nuclear contour from an ellipse is sometime useful in cell clas— sification. This paper presents a method based on Fourier series expansion, to determine the best fit ellipse to a given contour by minimizing the difference in the ellipticity factors. We show that the geometric mean should be used for the contour center instead of the conventional centroid. The method is applicable to multi value contours. Examples are presented.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Rahman Wali, Michael Colef, and Joseph Barba "Best fit ellipse for cell shape analysis", Proc. SPIE 1606, Visual Communications and Image Processing '91: Image Processing, (1 November 1991);

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