Accurate characterization of low-level vibration environments using seismological sensors and systems

Robert L. Nigbor

doi:10.1117/12.56845

1 February 1992 Accurate characterization of low-level vibration environments using seismological sensors and systems

Robert L. Nigbor

Proceedings Volume 1619, Vibration Control in Microelectronics, Optics, and Metrology; (1992) https://doi.org/10.1117/12.56845
Event: SPIE Technical: OPTCON '91, 1991, San Jose, CA, United States

Abstract

Characterization of very low amplitude, very low frequency vibration requires specialized sensors and systems not found within the standard industrial sources. Standard seismological instrumentation can be directly adapted to these difficult industrial vibration measurement needs. This paper studies the suitability for industrial vibration measurement of various classes of active and passive seismometers and seismological instrumentation systems. Current work by a USGS-sponsored working group on Standards for Seismometer Testing provides a formal framework with which to specify the ''Operating Range'' (combined frequency and amplitude range) of various sensors. Typical operating ranges of available sensors and systems are compared with low level industrial vibration ranges. Several case studies are presented as examples of the application of seismological instrumentation to low level industrial vibration characterization.

Citation Download Citation

Robert L. Nigbor "Accurate characterization of low-level vibration environments using seismological sensors and systems", Proc. SPIE 1619, Vibration Control in Microelectronics, Optics, and Metrology, (1 February 1992); https://doi.org/10.1117/12.56845

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