Implementation of a system to life test 2-D laser arrays

Thomas H. Faltus; Daniel J. Bicket

doi:10.1117/12.56857

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1 February 1992 Implementation of a system to life test 2-D laser arrays

Thomas H. Faltus, Daniel J. Bicket

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Proceedings Volume 1620, Laser Testing and Reliability; (1992) https://doi.org/10.1117/12.56857
Event: SPIE Technical: OPTCON '91, 1991, San Jose, CA, United States

Abstract

Multi-emitter laser devices, stacked to form 2-dimensional arrays, have been shown to effectively pump Nd:YAG slabs in solid state laser systems. Using these arrays as substitutes for flashlamps provides the potential for increased reliability of laser systems. However, to quantify this reliability improvement, laser arrays must be life tested. To ensure that the life test data accurately describes the array lifetimes, the life test system must possess the following characteristics: adequate control of operating stresses, to ensure that the test results apply to true use-conditions; continuous monitoring and recording of array health, to capture unpredictable variations in array performance; in-situ parameter measurement, to measure array performance without inducing handling damage; and extensive safety interlocks, to protect personnel from laser hazards. This paper describes an array life test system possessing these characteristics. It describes the system hardware, operating and test software, and the methodology behind the system's use. We demonstrate the system's performance by life testing 2-dimensional laser arrays having previously documented front facet anomalies. Disadvantages as well as advantages of design decisions are discussed.

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Thomas H. Faltus and Daniel J. Bicket "Implementation of a system to life test 2-D laser arrays", Proc. SPIE 1620, Laser Testing and Reliability, (1 February 1992); https://doi.org/10.1117/12.56857

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