1 February 1992 Optical feedback in diagnostic methods and testing of semiconductor laser diodes
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Proceedings Volume 1620, Laser Testing and Reliability; (1992) https://doi.org/10.1117/12.56858
Event: SPIE Technical: OPTCON '91, 1991, San Jose, CA, United States
Abstract
The asymmetries induced by optical feedback in semiconductor laser diodes inserted in optical systems provides a possible way of noninvasive monitoring laser dynamics and system properties. A method, based on a microscopic model for single-mode laser diodes with additional terms to describe optical feedback contribution, is proposed.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marziale Milani, Marziale Milani, S. Mazzoleni, S. Mazzoleni, Franca Brivio, Franca Brivio, } "Optical feedback in diagnostic methods and testing of semiconductor laser diodes", Proc. SPIE 1620, Laser Testing and Reliability, (1 February 1992); doi: 10.1117/12.56858; https://doi.org/10.1117/12.56858
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