1 February 1992 Optical feedback in diagnostic methods and testing of semiconductor laser diodes
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Proceedings Volume 1620, Laser Testing and Reliability; (1992) https://doi.org/10.1117/12.56858
Event: SPIE Technical: OPTCON '91, 1991, San Jose, CA, United States
Abstract
The asymmetries induced by optical feedback in semiconductor laser diodes inserted in optical systems provides a possible way of noninvasive monitoring laser dynamics and system properties. A method, based on a microscopic model for single-mode laser diodes with additional terms to describe optical feedback contribution, is proposed.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marziale Milani, Marziale Milani, S. Mazzoleni, S. Mazzoleni, Franca Brivio, Franca Brivio, "Optical feedback in diagnostic methods and testing of semiconductor laser diodes", Proc. SPIE 1620, Laser Testing and Reliability, (1 February 1992); doi: 10.1117/12.56858; https://doi.org/10.1117/12.56858
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