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16 December 1992 Defect mapping system for optoelectronic materials
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Proceedings Volume 1622, Emerging Optoelectronic Technologies; (1992)
Event: Emerging OE Technologies, Bangalore, India, 1991, Bangalore, India
The defect mapping system is built on the principle of Scanning Optical Microscope (SOM). It''s essentially an optical probe with an xY translational stage and a Data Acquisition System (DAS). The SOM can be used in three different modes namely Reflection Transmission and Light Beam Induced Current (LBIC). In this paper the instrumentation and it''s capability as SOM and in LBIC mode has been demonstrated. I
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. S .R. K. Rao, K. R. Ramakrishnan, and Vikram Kumar "Defect mapping system for optoelectronic materials", Proc. SPIE 1622, Emerging Optoelectronic Technologies, (16 December 1992);

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