29 July 1992 Examination of laser conditioning using atomic-force microscopy
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The modification of an optical coating surface with laser exposure at fluences below the damage threshold resulted in localized minimization of asperities. Topological changes with time were mapped using an atomic force microscope. It is suggested that charge accumulation on the dielectric coating drives the surface morphology to higher uniformity.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Aleta A. Tesar, Aleta A. Tesar, Mehdi Balooch, Mehdi Balooch, Robert J. Tench, Robert J. Tench, Christopher J. Stolz, Christopher J. Stolz, Timothy G. Sarginson, Timothy G. Sarginson, Wigbert J. Siekhaus, Wigbert J. Siekhaus, "Examination of laser conditioning using atomic-force microscopy", Proc. SPIE 1624, Laser-Induced Damage in Optical Materials: 1991, (29 July 1992); doi: 10.1117/12.60121; https://doi.org/10.1117/12.60121

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