High-power, high-reliability laser diodes

Donald R. Scifres; David F. Welch; Richard R. Craig; Erik P. Zucker; Jo S. Major Jr.; Gary L. Harnagel; Masamichi Sakamoto; James M. Haden; John G. Endriz; Hsing H. Kung

doi:10.1117/12.59136

26 June 1992 High power, high reliability laser diodes

Donald R. Scifres, David F. Welch, Richard R. Craig, Erik P. Zucker, Jo S. Major Jr., Gary L. Harnagel, Masamichi Sakamoto, James M. Haden, John G. Endriz, Hsing H. Kung

Author Affiliations +

Proceedings Volume 1634, Laser Diode Technology and Applications IV; (1992) https://doi.org/10.1117/12.59136
Event: OE/LASE '92, 1992, Los Angeles, CA, United States

Abstract

Results are presented on catastrophic damage limits and life-test measurements for four types of high-power laser diodes operating at wavelengths between 980 nm and 690 nm. The laser diodes under consideration are CW multimode lasers, CW laser bars, quasi-CW bars/2D stacked arrays, and single transverse mode lasers.

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Donald R. Scifres, David F. Welch, Richard R. Craig, Erik P. Zucker, Jo S. Major Jr., Gary L. Harnagel, Masamichi Sakamoto, James M. Haden, John G. Endriz, and Hsing H. Kung "High power, high reliability laser diodes", Proc. SPIE 1634, Laser Diode Technology and Applications IV, (26 June 1992); https://doi.org/10.1117/12.59136

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