1 May 1992 Spectral analysis of surfaces at subwavelength resolution
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Proceedings Volume 1637, Environmental and Process Monitoring Technologies; (1992); doi: 10.1117/12.59322
Event: OE/LASE '92, 1992, Los Angeles, CA, United States
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© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Raoul Kopelman, Steven Smith, Weihong Tan, Renato Zenobi, Klony S. Lieberman, Aaron Lewis, "Spectral analysis of surfaces at subwavelength resolution", Proc. SPIE 1637, Environmental and Process Monitoring Technologies, (1 May 1992); doi: 10.1117/12.59322; https://doi.org/10.1117/12.59322
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KEYWORDS
Photons

Excitons

Molecules

Crystals

Luminescence

Near field optics

Scanning tunneling microscopy

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