1 May 1992 Chromosome structure investigated with the atomic-force microscope
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Proceedings Volume 1639, Scanning Probe Microscopies; (1992); doi: 10.1117/12.58188
Event: OE/LASE '92, 1992, Los Angeles, CA, United States
Abstract
We have developed an atomic force microscope (AFM) with an integrated optical microscope. The optical microscope consists of an inverted epi-illumination system that yields images in reflection or fluorescence of the sample. With this system it is possible to quickly locate an object of interest. A high-resolution image of the object thus selected can then be obtained with the AFM that is built on top of the optical microscope. In addition, the combined microscopes enable a direct comparison between the optical image and the topography of the same object. The microscope is used to study the structure of metaphase chromosomes of eukaryotic cells. The topography of metaphase chromosomes reveal grooved structures that might indicate spiral structure of the chromatin. High resolution images reveal structures that can be ascribed to the end loops of the chromatin. The resolution of the AFM images was improved by using sharper tips obtained by carbon deposition on the Si3N4 cantilevers using a scanning electron microscope. Chromosomes which are treated to reveal the G- banding pattern in the optical microscope display a similar pattern when viewed with the AFM, as is shown by a direct comparison.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bart G. de Grooth, Constant A.J. Putman, Kees O. van der Werf, Niko F. van Hulst, Geeske van Oort, Jan Greve, "Chromosome structure investigated with the atomic-force microscope", Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); doi: 10.1117/12.58188; https://doi.org/10.1117/12.58188
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KEYWORDS
Atomic force microscopy

Microscopes

Optical microscopes

Image resolution

Scanning electron microscopy

Atomic force microscope

Scanning probe microscopy

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