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1 May 1992 Dynamic studies of crystal growth using the AFM
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Proceedings Volume 1639, Scanning Probe Microscopies; (1992)
Event: OE/LASE '92, 1992, Los Angeles, CA, United States
Recent advances in AFM technology allow direct observation of solution growth and dissolution (etching) processes important in industry and nature, and direct tests of crystal growth models. We present results of studies of calcite and quartz, including real-time, in situ observations. While both crystals experience layer growth/dissolution, calcite grows by direct addition of material to growth steps without an important contribution from surface diffusion; quartz surfaces are consistent with more traditional, BCF-type growth models. Dynamic AFM observations of growth processes may allow optimization of industrial systems.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andrew J. Gratz, Paul E. Hillner, Srinivas Manne, and Paul K. Hansma "Dynamic studies of crystal growth using the AFM", Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992);

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