1 May 1992 Influence of surface topography on light emission from tunnel junctions
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Proceedings Volume 1639, Scanning Probe Microscopies; (1992) https://doi.org/10.1117/12.58176
Event: OE/LASE '92, 1992, Los Angeles, CA, United States
Abstract
Visible light is emitted from roughened metal-oxide-metal tunnel junctions subjected to a small (2 - 4 V) dc bias. The color of the emitted light is voltage tunable but device quantum efficiency is generally very low (10-5 - 10-7). The optical emission is due to the roughness induced scattering of electronically excited surface plasmon polaritons. The characteristics of the surface roughness are clearly important in determining the overall device efficiency and spectral output. With a view to better understanding and improving the efficiency we have examined the surface topography of variously roughened devices and relate this to the optical output. For example, we have roughened devices by means of holographic crossed diffraction grating substrates which possess surface topography of greater rms roughness height and larger transverse correlation length than that of devices roughened by a pre-deposited CaF2 layer. Devices roughened by means of a particulate aluminum substrate are also discussed.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. J. Leonard Ferguson, A. J. Leonard Ferguson, Paul Dawson, Paul Dawson, K. W. Smith, K. W. Smith, R. J. Turner, R. J. Turner, H. P. Hagan, H. P. Hagan, D. George Walmsley, D. George Walmsley, } "Influence of surface topography on light emission from tunnel junctions", Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); doi: 10.1117/12.58176; https://doi.org/10.1117/12.58176
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