1 May 1992 Membrane-membrane and membrane-substrate adhesion during dissection of gap junctions with the atomic-force microscope
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Proceedings Volume 1639, Scanning Probe Microscopies; (1992); doi: 10.1117/12.58187
Event: OE/LASE '92, 1992, Los Angeles, CA, United States
Abstract
The gap junction is a specialized region of the plasma membrane that consists of an array of cell-to-cell ion channels. These channels form where the membranes from two cells come together, and the gap junction is therefore composed of two lipid bilayers. The atomic force microscope (AFM) can be used to dissect the gap junction, removing one membrane and exposing the extracellular domains of the second. The force required to dissect the membrane, near 10-8 N vertical force for gap junctions adsorbed to mica, provides a measure of the strength of the interaction between the two membranes. Since a single membrane is left in contact with the mica, this interaction must be stronger than the membrane-membrane interaction. Non-junctional membrane attached to the gap junctions is easily removed with the AFM tip while the gap junction membrane remains attached to the mica, providing evidence that the interaction with the mica is mainly mediated by protein-mica interactions. Consistent with this hypothesis is the observation that material trapped under the membrane sometimes results in pieces of membrane above the material being pulled out during dissection. These results lay the foundation for examining the molecular details of the basis for membrane- membrane and membrane-substrate adhesion.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jan H. Hoh, Jean-Paul Revel, Paul K. Hansma, "Membrane-membrane and membrane-substrate adhesion during dissection of gap junctions with the atomic-force microscope", Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); doi: 10.1117/12.58187; https://doi.org/10.1117/12.58187
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KEYWORDS
Mica

Atomic force microscopy

Atomic force microscope

Ion channels

Microscopes

Scanning probe microscopy

Electron microscopy

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