1 May 1992 Resolution issues in scanning optical microscopies
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Proceedings Volume 1639, Scanning Probe Microscopies; (1992) https://doi.org/10.1117/12.58171
Event: OE/LASE '92, 1992, Los Angeles, CA, United States
Abstract
Several issues concerning lateral spatial resolution in scanning optical microscopes, SOM's, are addressed. After identifying what is meant by resolution in an SOM, the role of probe tip morphology is discussed. Consideration of the physical mechanism of signal transduction is made, and fundamental differences between near field SOM's and evanescent field SOM's are underscored. Therole of dithering of the probe tip in improving resolution is demonstrated and discussed.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric L. Buckland, Patrick J. Moyer, Michael A. Paesler, "Resolution issues in scanning optical microscopies", Proc. SPIE 1639, Scanning Probe Microscopies, (1 May 1992); doi: 10.1117/12.58171; https://doi.org/10.1117/12.58171
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