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1 April 1992 Analysis of noise sources in frequency-domain fluorometry
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Abstract
In frequency domain fluorometry, as well as all other spectroscopic techniques, the noise ultimately limits the sensitivity of the instrument and the precision of the measurement. The analysis of the sources of noise in different instruments has revealed that the noise is due to a number of different instrumental factors rather than photon statistics. The ultimate goal is to eliminate those factors to achieve a situation in which the limit is the detector intrinsic noise. We have developed a system, based on digital signal processing, in which the influence of several spurious noise sources has been reduced. A study of the range of cross-correlation frequencies used to obtain the best signal-to-noise ratio is presented.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Martin J. vandeVen, Beniamino B. Barbieri, Enrico Gratton, and John S. Maier "Analysis of noise sources in frequency-domain fluorometry", Proc. SPIE 1640, Time-Resolved Laser Spectroscopy in Biochemistry III, (1 April 1992); https://doi.org/10.1117/12.58225
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