1 June 1992 Calculation of electron-optical characteristics for Gen I image intensifiers under the deflection and gating regime
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Abstract
An efficient method for calculating electron-optical characteristics of electrostatic electron- optical systems (EOS) for focusing and deflection (gating) in image intensifiers is proposed. Dwelling on this method based on perturbation theory (which in electron optics is usually called the aberration theory) the paper presents EOS characteristics estimated using software support for the relevant computer-aided design (CAD) system. Some examples of CAD of different EOS constructive implementations are provided.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergey V. Kolesnikov, "Calculation of electron-optical characteristics for Gen I image intensifiers under the deflection and gating regime", Proc. SPIE 1655, Electron Tubes and Image Intensifiers, (1 June 1992); doi: 10.1117/12.60325; https://doi.org/10.1117/12.60325
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KEYWORDS
Computer aided design

Image intensifiers

Particles

Tolerancing

Scattering

Charged particle optics

Computer simulations

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