High-resolution Schottky barrier infrared image sensor

Masafumi Kimata; Naoki Yutani; Natsuro Tsubouchi

doi:10.1117/12.135900

Abstract

We have developed a series of Schottky-barrier infrared image sensors with a novel readout architecture called the charge sweep device (CSD). Compared with the conventional interline transfer CCD image sensor, the CSD image sensor has a larger charge handling capacity and is suitable for thermal imaging where we have to detect a small signal in a large background. This paper describes the design and performance of the CSD image sensors. The devices described here include a 512x512 element IRCSD, a small size 256x256 element IRCSD, a 256x256 element IRCSD which has the lowest noise equivalent temperature difference of 0.036K (f/1.2), and a 1040x1040 element IRCSD which is the highest resolution device among infrared image sensors.

Citation Download Citation

Masafumi Kimata, Naoki Yutani, Natsuro Tsubouchi, "High-resolution Schottky barrier infrared image sensor", Proc. SPIE 1656, High-Resolution Sensors and Hybrid Systems, (12 August 1992); doi: 10.1117/12.135900; https://doi.org/10.1117/12.135900

ACCESS THE FULL ARTICLE

PERSONAL SIGN IN
Full access may be available with your subscription

Email or Username Forgot your username?

Password Forgot your password?

Show

Remember Email/Username on this computer

Remember Password

No SPIE account? Create an account
or Institutional Sign In via Shibboleth

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $14.40

Non-members: $18.00 ADD TO CART

Show All Keywords

Keywords/Phrases

Search In:

Publication Years