Paper
21 October 1992 Ultrafast thermal nonlinearities in amorphous silicon
Philippe M. Fauchet, Daniele Hulin, A. Mourchid, Regis Vanderhaghen
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Abstract
We report the observation in a-Si:H of a large thermal nonlinearity with a picosecond response time. The spectral dependence of the refractive and absorptive parts of this unusually fast thermal nonlinearity reveals that it arises from a picosecond nonradiative recombination of electrons and holes across the band gap. The optical and electronic processes that make this thermal nonlinearity possible and observable are discussed.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Philippe M. Fauchet, Daniele Hulin, A. Mourchid, and Regis Vanderhaghen "Ultrafast thermal nonlinearities in amorphous silicon", Proc. SPIE 1677, Ultrafast Lasers Probe Phenomena in Semiconductors and Superconductors, (21 October 1992); https://doi.org/10.1117/12.137681
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KEYWORDS
Picosecond phenomena

Absorption

Scattering

Crystals

Electrons

Semiconductors

Amorphous semiconductors

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