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1 July 1992 Raman spectroscopy study of interdiffusion in Si/SiGe superlattices
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The use of Raman spectroscopy to study interdiffusion in SiGe/Si superlattices and multilayers has been considered. We have modeled the interdiffusion process using an error function concentration profile and modeled the Raman scattering spectrum as an integration over this profile. The calculation has been compared to experimental data. The Raman spectra were calculated by appropriately averaging over the diffused interface. We find good agreement between the calculated and measured spectra. The Raman spectra are shown to be sensitive to the interfacial profile.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Orest J. Glembocki and Sharka M. Prokes "Raman spectroscopy study of interdiffusion in Si/SiGe superlattices", Proc. SPIE 1678, Spectroscopic Characterization Techniques for Semiconductor Technology IV, (1 July 1992);

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