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12 August 1992 Popcorn noise in linear In0.53Ga0.47As detector arrays
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Popcorn noise, also called burst noise, manifests itself as a random charge fluctuation in linear In0.53Ga0.47As detector arrays. The noise is not present in all the devices; it may affect only 1 or 2% of the photodiodes at a moderately high reverse bias (5 V) but represents a potential performance limitation for the InGaAs photodetector arrays. The random charge fluctuations can be of the order of a few hundred to a million electrons at room temperature and can also be observed at temperatures as low as 200 K. Our studies suggest that dislocations which originate in the InP substrate are the major cause of popcorn noise. This noise can be significantly reduced or completely eliminated by reducing the reverse bias of the photodiodes from 5 V to 2 V or less. Crystal defects seem to cause the popcorn noise when the diode is substantially depleted. A lower reverse bias prevents the depletion width from reaching these defects and thereby prevents the possible generation of popcorn noise.
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Abhay M. Joshi, Gregory H. Olsen, Vladimir S. Ban, E. Mykietyn, and D. R. Mohr "Popcorn noise in linear In0.53Ga0.47As detector arrays", Proc. SPIE 1683, Infrared Focal Plane Array Producibility and Related Materials, (12 August 1992);

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