1 July 1992 All-digital monolithic scanning readout based on sigma-delta analog-to-digital conversion
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Abstract
It is generally accepted that sensor systems can benefit from some form of on-focal-plane A/D conversion in terms of overall system noise improvement. The issue of whether or not the Delta-Sigma modulation process can be applied to the development of an approach using conventional A/D converters or cryogenic circuit materials is addressed from the standpoint of the scanning focal plane. Each pixel row of the scanning sensor is treated as a continuous analog signal source with a fixed signal bandwidth. By allocating a Delta-Sigma converter per sensor pixel row, theory predicts the oversample rate required to achieve the designed conversion resolution. The Delta-Sigma consists of two major parts. The modulator, which samples the analog input and develops a corresponding digital bit stream, and the digital signal processor, which compresses the bit stream into the Nyquist rate multibit codes and performs noise filtering, are described. Only the modulator needs to be on the focal plane since its output is digital. This reduces the development problem to one of fitting the modulator only into the allocated space and power budget per sensor.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William J. Mandl and Carl M. Rutschow "All-digital monolithic scanning readout based on sigma-delta analog-to-digital conversion", Proc. SPIE 1684, Infrared Readout Electronics, (1 July 1992); doi: 10.1117/12.60513; https://doi.org/10.1117/12.60513
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