1 September 1992 Element of a new infrared detector-plasma edge detector
Author Affiliations +
Plasma reflectivity edge in infrared reflectivity spectra measured on narrow-gap semiconductors has been found to be most sensitive to the variation of carrier concentration based upon which a new way of infrared modulation has been studied. The modulation gain in power is impressively high. Thus a less sensitive room-temperature infrared detector could be as sensitive as the existing cooled infrared detectors in detecting middle-infrared radiation. The detectivity has been calculated.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dingrong Qian, Dingrong Qian, } "Element of a new infrared detector-plasma edge detector", Proc. SPIE 1685, Infrared Detectors and Focal Plane Arrays II, (1 September 1992); doi: 10.1117/12.137802; https://doi.org/10.1117/12.137802


Advances In HgCdTe Infrared Focal Plane Technology
Proceedings of SPIE (November 08 1977)
Research on a novel infrared moisture instrument
Proceedings of SPIE (February 22 2006)
Reflecting Coatings
Proceedings of SPIE (July 06 1986)

Back to Top