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1 July 1992 High-precision MTF measurement instrument for focal-plane arrays with on-chip TDI
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Abstract
The development of focal plane arrays with considerable on-chip processing, notably time-delayed integration, imposes new and severe requirements on the instrumentation to establish the modulation transfer function (MTF) of the integrated focal plane array. This paper describes an instrument to obtain the MTF for such arrays with a high level of accuracy. This instrument was built, and associated errors were obtained experimentally. The instrument uses sine-wave amplitude modulation across the spatial frequency spectrum to reach the Nyquist frequency of the focal plane array. Various algorithms to derive the MTF from the experimental data were investigated; the preferred approach is presented.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Harold Gumbel, Sherman L. Golub, Frank W. Adams Jr., Kevin Morimoto, Paul G. Wolford, and Robert B. Jones "High-precision MTF measurement instrument for focal-plane arrays with on-chip TDI", Proc. SPIE 1686, Test and Evaluation of IR Detectors and Arrays II, (1 July 1992); https://doi.org/10.1117/12.60530
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