High-throughput testing and characterization of IR readouts and hybrids

William J. Mandl; Khang X. Bui; Manilal J. Patel

doi:10.1117/12.60521

1 July 1992 High-throughput testing and characterization of IR readouts and hybrids

William J. Mandl, Khang X. Bui, Manilal J. Patel

Proceedings Volume 1686, Test and Evaluation of IR Detectors and Arrays II; (1992) https://doi.org/10.1117/12.60521
Event: Aerospace Sensing, 1992, Orlando, FL, United States

Abstract

A program to upgrade the test capability for JR focal plane arrays and readouts is in progress at Aerojet. The objective of the development is to reduce the number and complexity of the steps in the test process, reduce in socket test time and provide a simplified set up procedure for production testing. There are two areas of study in the program. One is concerned with examining multiple fabrication sources for readout circuits. Cooperative studies are being performed with Orbit Semiconductor, Harris Semiconductor, TRW, UTMC, and Matra (France). Temperature profiles of noise performance, threshold variation, gain and subthreshold operation are being developed for several different manufacturers. The objective is to determine the feasibility of eliminating all cryogenic testing for sorting of readouts before final hybrid assembly thus reducing test steps. The second area of development, which will be discussed in this paper, is the application of a commercially available automated test system for production testing and engineering characterization ofreadouts and focal plane arrays. The Sentry Series 80 mixed signal tester is being fixtured for low noise measurements and interfacing to dewars for cryogenic testing. The multiuser foregroundlbackground operating system software has the advantage of allowing noise and other statistical calculations to be performed in the background without impeding test measurements. It also has the advantage in production of requiring no manual instrumentation set up or interconnect. The improvements in test throughput and analysis capability will be shown in adapting this class of tester as opposed to assembling test instruments in a custom made computer controlled test approach

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William J. Mandl, Khang X. Bui, and Manilal J. Patel "High-throughput testing and characterization of IR readouts and hybrids", Proc. SPIE 1686, Test and Evaluation of IR Detectors and Arrays II, (1 July 1992); https://doi.org/10.1117/12.60521

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KEYWORDS

Control systems

Infrared detectors

Cryogenics

Head

Semiconductors

Analog electronics

Interference (communication)

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