16 September 1992 Achieving high-temperature measurement accuracy over a wide ambient-temperature range in thermal imaging radiometers
Author Affiliations +
This paper reviews the accuracy requirements ofthermal imaging radiometers, for various wavelengths and optical configurations, that must be maintained over the specified ambient temperature range for the instrument. The paper focuses on the Inframetrics 700 Series Radiometers, and briefly reviews the scanner architecture and video signal processing electronics to provide a background for the problem presented. Subsystem component parametric variations, affected by fluctuations in ambient temperature, are enumerated. These variations directly affect the temperature measurement accuracy ofthe system. To exceed the temperature measurement accuracy specification for the instrument, and achieve the highest measurement accuracy possible, Inframetrics individually calibrates each radiometer over the specffied ambient temperature range. This paper describes the Ambient Temperature Calibration (ATC) process. Data collection and test methods used to develop this process are outlined. Initial and ongoing process validation methodology is discussed. Product quality and reliability benefits as a byproduct of this process are also presented.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert J. Herring, Robert J. Herring, } "Achieving high-temperature measurement accuracy over a wide ambient-temperature range in thermal imaging radiometers", Proc. SPIE 1689, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing III, (16 September 1992); doi: 10.1117/12.137980; https://doi.org/10.1117/12.137980


Challenges in IR system testing
Proceedings of SPIE (October 16 1994)
What's Out There State Of The Art Survey Of...
Proceedings of SPIE (March 20 1983)
Testing Thermal Imaging Systems
Proceedings of SPIE (October 28 1981)
Design considerations for infrared imaging radiometers
Proceedings of SPIE (June 30 1991)

Back to Top