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16 September 1992 Sensor effects simulation for synthetic signature modeling using the strategic scene workstation
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This paper describes the capabilities, models, and implementation of the SSW sensor model software, and illustrates its utility in processing computer-generated signatures. Sample images illustrate the results of processing computed images with different components of the 55W sensor model. Synthetic scene modeling and signature generation have become important tools used in the development of complex sensor systems for smart weapons. Simulated signatures have proven useful by providing realistic data to support system development, performance prediction, validation, and trade studies for signal processing applications and entire systems. In addition, comparisons between computed signatures and measured data can provide insight into signature phenomenology and modeling. Standard signature prediction codes do not account for effects caused by the sensor. These effects can cause measured signatures to differ significantly from predictions, and may critically affect the performance of applications which use the data. The Strategic Scene Workstation (55W), developed by Nichols Research Corporation for the USAF Wright Laboratory, Armament Directorate, includes a computer model designed to simulate sensor effects in computed signatures. The 55W sensor model simulates spatial effects, noise, and detector characteristics typical if passive sensors used in strategic applications. This function is necessary to custon ze predicted signatures, and has been used effectively to enhance the realism and accuracy of simulated signatures for applications including hardware in the loop simulation at the USAF KHILS facility at Eglin AFB, FL.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Breck A. Sieglinger, Mark T. Finch, and Victoria T. Franques "Sensor effects simulation for synthetic signature modeling using the strategic scene workstation", Proc. SPIE 1689, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing III, (16 September 1992);


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