18 August 1992 Excite-probe two-color Z-scan
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Abstract
Using an excite-i,robe two-co1or Zscan technique, we investigate the dynamics of optical nonlinearites in semiconductors with picosecond pulses at 1.06 and 0.532 pm. We use the technique to obtain a direct timeresolved measurement of the nondegenerate nonlinear refraction in polycrystalline ZnSe and show how it can resolve the bound electronic and free carrier components.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiang-Wei Wang, Mansoor Sheik-Bahae, Ali A. Said, David J. Hagan, and Eric W. Van Stryland "Excite-probe two-color Z-scan", Proc. SPIE 1692, Nonlinear and Electro-Optic Materials for Optical Switching, (18 August 1992); doi: 10.1117/12.138069; https://doi.org/10.1117/12.138069
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