Fully-Integrated On-Line Process Control System Employing Microcomputer-Based IR Spectrometer

Frederic M. Zweibaum

doi:10.1117/12.957034

8 May 1971 Fully-Integrated On-Line Process Control System Employing Microcomputer-Based IR Spectrometer

Frederic M. Zweibaum

Proceedings Volume 0170, Optics in Quality Assurance II; (1971) https://doi.org/10.1117/12.957034
Event: Los Angeles Technical Symposium, 1979, Los Angeles, United States

Abstract

The paper describes the control problem in terms of the constraining parameters: the nature of the process plant environment, the process and its constituents, methods of sensing the process, spectral characteristics of the process infrared emission and absorption, and the time lag between a process adjustment and the resulting change in the observed characteristics. Considered in detail is the manner in which the process control system operates within the sphere of these constraints together with the transfer of data and control signals. Examples are included of system operation in laboratory, plastic and gas process analysis and in an experimental coal gassification unit.

Citation Download Citation

Frederic M. Zweibaum "Fully-Integrated On-Line Process Control System Employing Microcomputer-Based IR Spectrometer", Proc. SPIE 0170, Optics in Quality Assurance II, (8 May 1971); https://doi.org/10.1117/12.957034

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